Changelog

Changelog#

All notable changes to this project will be documented in this file.

The format is based on Keep a Changelog, and this project adheres to Semantic Versioning.

[0.3.0]#

Improve the repository architecture and simplify the API. Breaking changes included.

Changed#

  • Reader class now takes care of raw file interaction (image and metadata).

  • Analyzer now takes care of domain specific analysis.

  • Analyzer class is rewritten as a base class.

  • ROI inputs are now explicitly defined instead of an ROI object.

  • Config class now takes care of workflow configurations.

  • Update domain specific analyzers.

  • Improved XPS fitting workflow to allow for manual fitting input in the class method.

Added#

  • ReaderGroup class that adds time interval to the metadata.

  • Analyzer workflow now more explicit for reproducibility.

  • Workflow class now can read, run, and export the configuration file and content.

  • Add AreaROIs such as circle, rectangle, and ellipse.

  • Add XASAnalyzer for X-ray absorption image stack analysis.

  • Add LEEMAnalyzer for LEEM image stack analysis.

  • Add annotation and operation modules.

  • Add drift correction algorithm for LEEM and XAS measurements.

  • Add example.ipynb for analysis examples.

Removed#

  • Remove AnalyzerGroup class and associated domain specific group analyzers.

  • Remove StitchAnalyzer class and moved stitch functionality to the spectra analyzer.

[0.2.1]#

Added#

  • Add GitHub templates for issues and pull requests.

  • Add GitHub Actions workflow to publish distributions to PyPI on release.

Fixed#

  • Decode LEEM/UView metadata strings (FOV, image title, recipe) as Windows cp1252 instead of UTF-8, fixing a UnicodeDecodeError on the micro sign (byte 0xb5, e.g. a “10um” FOV).

[0.2.0]#

LICENSE changed to BSD 3-Clause license with BNL/DOE notices.

Changed#

  • Change license to BSD 3-Clause license.

  • Add NOTICE with Brookhaven National Laboratory, U.S. Department of Energy, and U.S. Government rights notices.

  • Change “amorphleed” module to “desp” module to more accurate describe the diffuse elastic scattering pattern measurement.

  • Change image processing and radius detect through contour method.

  • Analyzer reader class moved to class attribute.

  • Move the calibration output the analyzer group for a cleaner logic. Both domain analyer and analyer group requires calibration parameters.

  • Change filtered_profile method to process_profile

  • Change calibrate module to config module.

  • Change configuration file logic and calibration method for domain specific analyzers.

  • Rename analysis.py to analyzer.py.

  • Move StitchAnalyzer to pyleem.analysis.stitch module.

  • Move domain specific modules under analysis/ submodule.

Added#

  • Add convolution based (template matching) method for desp disk pattern detection.

[0.1.1]#

Fixed#

  • Fixed the radius detection issue where the radius does not have to be an int.

[0.1.0]#

Added#

  • analysis module: Analyzer, ProfileAnalyzer, AnalyzerGroup, and StitchAnalyzer base classes.

  • sees module: SEESAnalyzer and SEESGroup for secondary electron energy spectroscopy.

  • amorphleed module: AmorphLEEDAnalyzer and AmorphLEEDGroup for amorphous LEED pattern analysis.

  • calibrate module: TOML-based calibration workflow with read/write helpers.

  • utils module: find_onset(), find_stitch_points(), and stitch_profiles().

Changed#

  • Rename calibration.py to calibrate.py.

  • Rename se.py to sees.py.

  • Remove h5 raw file and roi output.

Fixed#

  • Fix shirley_background calculation method.

[0.0.1]#

Initial release. This version includes functionality to read raw LEEM data, and analysis tools for LEEM XPS experiments.

  • Create the spectra classes

  • Create the image classes