LEEM Analysis

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LEEM Analysis#

Low Energy Electron Microscopy (LEEM) I-V analysis measures surface-dependent electron reflectivity versus electron energy. LEEMIVAnalyzer is the analyzer for LEEM I-V analysis. Drift correction is available as an explicit step before intensity extraction. If the correct_drift method is not called, the raw image is used for analysis. The shift information can be separately accessed from the method calculate_drift(). The analysis measures the intensity over the image stack versus electron energy (“Start Voltage”). The “Start Voltage” metadata is stored by default in the raw file. The analyzer uses the FullFieldBase base class for drift correction logics.

Example#

from pyleem.analysis.leem import LEEMIVAnalyzer
from pyleem.reader import UViewReader, read_files
from pyleem.roi import RectROI

readers = read_files(
    ["xas_0.dat", "xas_1.dat", "xas_2.dat"],
    reader_cls=UViewReader
)
roi = RectROI(top=20, left=30, bottom=80, right=90)

analyzer = LEEMIVAnalyzer(readers, roi=roi)
analyzer.correct_drift(sigma=3, crop_size=128)
intensities = analyzer.get_intensities()

ax = analyzer.plot_intensity()
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